Products

TetraX Compact - AFM Lateral Force Calibrator

Due to our new technique, quantitative measurements in Lateral Force Microscopy  become real!

  • Inaccuracy equal to approximately 3%
  • Automated and innovative Lateral Force Calibration
  • High-performance and precision
  • Compatibility with many models of AFM’s

The method is easy to perform and could be widely used for the lateral force calibration constant determination in many types of atomic force microscopes.

Custom design

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